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Manufacturer: Pomona Electronics Description: Clip, Test; 14; Male; Glass Filled Nylon; Nickel Silver; 0.18 in.; 102 degC (Max DIP Clip test adapters are designed especially for testing dual-in-line IC packages on high-density PC boards. The DIP Clip test adapter has many built-in features that assure a positive electrical connection and at the same time provide hands-free testing. The high-density DIP Clip TEST adapters are used for ultra-dense packaged chips located adjacent to each other on 2.54 mm (0.100) spacing. Material: Contact, tarnish resistant nickel, silver- or gold-plated beryllium copper. Stainless steel hinge pin and spring. Insulation: Glass-filled nylon, blue. Rating: 500 V RMS ; 1 amp; +102°C (+216°F) max.

Manufacturer: Pomona Electronics Description: Clip, Test; 16; Male; Glass Filled Nylon; Nickel Silver; 0.18 in.; 102 degC (Max DIP Clip test adapters are designed especially for testing dual-in-line IC packages on high-density PC boards. The DIP Clip test adapter has many built-in features that assure a positive electrical connection and at the same time provide hands-free testing. The high-density DIP Clip TEST adapters are used for ultra-dense packaged chips located adjacent to each other on 2.54 mm (0.100) spacing. Material: Contact, tarnish resistant nickel, silver- or gold-plated beryllium copper. Stainless steel hinge pin and spring. Insulation: Glass-filled nylon, blue. Rating: 500 V RMS ; 1 amp; +102°C (+216°F) max.

Manufacturer: Pomona Electronics Description: Clip, Test; 14; Male; Glass Filled Nylon; Nickel Silver; 0.18 in.; 102 degC (Max DIP Clip test adapters are designed especially for testing dual-in-line IC packages on high-density PC boards. The DIP Clip test adapter has many built-in features that assure a positive electrical connection and at the same time provide hands-free testing. The high-density DIP Clip TEST adapters are used for ultra-dense packaged chips located adjacent to each other on 2.54 mm (0.100) spacing. Material: Contact, tarnish resistant nickel, silver- or gold-plated beryllium copper. Stainless steel hinge pin and spring. Insulation: Glass-filled nylon, blue. Rating: 500 V RMS ; 1 amp; +102°C (+216°F) max.

Manufacturer: Pomona Electronics Description: Test Clip, Standard, 24 Pin DIP DIP Clip test adapters are designed especially for testing dual-in-line IC packages on high-density PC boards. The DIP Clip test adapter has many built-in features that assure a positive electrical connection and at the same time provide hands-free testing. The high-density DIP Clip TEST adapters are used for ultra-dense packaged chips located adjacent to each other on 2.54 mm (0.100) spacing. Material: Contact, tarnish resistant nickel, silver- or gold-plated beryllium copper. Stainless steel hinge pin and spring. Insulation: Glass-filled nylon, blue. Rating: 500 V RMS ; 1 amp; +102°C (+216°F) max.

Manufacturer: Pomona Electronics Description: Test Clip, Standard, 40 Pin DIP DIP Clip test adapters are designed especially for testing dual-in-line IC packages on high-density PC boards. The DIP Clip test adapter has many built-in features that assure a positive electrical connection and at the same time provide hands-free testing. The high-density DIP Clip TEST adapters are used for ultra-dense packaged chips located adjacent to each other on 2.54 mm (0.100) spacing. Material: Contact, tarnish resistant nickel, silver- or gold-plated beryllium copper. Stainless steel hinge pin and spring. Insulation: Glass-filled nylon, blue. Rating: 500 V RMS ; 1 amp; +102°C (+216°F) max.

Manufacturer: Pomona Electronics Description: Clip, Test; 16; Male; Glass Filled Nylon; Nickel Silver; 0.18 in.; 102 degC (Max DIP Clip test adapters are designed especially for testing dual-in-line IC packages on high-density PC boards. The DIP Clip test adapter has many built-in features that assure a positive electrical connection and at the same time provide hands-free testing. The high-density DIP Clip TEST adapters are used for ultra-dense packaged chips located adjacent to each other on 2.54 mm (0.100) spacing. Material: Contact, tarnish resistant nickel, silver- or gold-plated beryllium copper. Stainless steel hinge pin and spring. Insulation: Glass-filled nylon, blue. Rating: 500 V RMS ; 1 amp; +102°C (+216°F) max.

Manufacturer: Pomona Electronics Description: Clip, Test; 20; Male; Glass Filled Nylon; Be-Cu, Gold Plate; 0.18 in. DIP Clip test adapters are designed especially for testing dual-in-line IC packages on high-density PC boards. The DIP Clip test adapter has many built-in features that assure a positive electrical connection and at the same time provide hands-free testing. The high-density DIP Clip TEST adapters are used for ultra-dense packaged chips located adjacent to each other on 2.54 mm (0.100) spacing. Material: Contact, tarnish resistant nickel, silver- or gold-plated beryllium copper. Stainless steel hinge pin and spring. Insulation: Glass-filled nylon, blue. Rating: 500 V RMS ; 1 amp; +102°C (+216°F) max.

Manufacturer: Pomona Electronics Description: High Density Test Clips, 40 Pin DIP DIP Clip test adapters are designed especially for testing dual-in-line IC packages on high-density PC boards. The DIP Clip test adapter has many built-in features that assure a positive electrical connection and at the same time provide hands-free testing. The high-density DIP Clip TEST adapters are used for ultra-dense packaged chips located adjacent to each other on 2.54 mm (0.100) spacing. Material: Contact, tarnish resistant nickel, silver- or gold-plated beryllium copper. Stainless steel hinge pin and spring. Insulation: Glass-filled nylon, blue. Rating: 500 V RMS ; 1 amp; +102°C (+216°F) max.

Manufacturer: Pomona Electronics Description: High Density Test Clips, 20 Pin DIP DIP Clip test adapters are designed especially for testing dual-in-line IC packages on high-density PC boards. The DIP Clip test adapter has many built-in features that assure a positive electrical connection and at the same time provide hands-free testing. The high-density DIP Clip TEST adapters are used for ultra-dense packaged chips located adjacent to each other on 2.54 mm (0.100) spacing. Material: Contact, tarnish resistant nickel, silver- or gold-plated beryllium copper. Stainless steel hinge pin and spring. Insulation: Glass-filled nylon, blue. Rating: 500 V RMS ; 1 amp; +102°C (+216°F) max.

Manufacturer: Pomona Electronics Description: High Density Test Clips, 24 Pin DIP DIP Clip test adapters are designed especially for testing dual-in-line IC packages on high-density PC boards. The DIP Clip test adapter has many built-in features that assure a positive electrical connection and at the same time provide hands-free testing. The high-density DIP Clip TEST adapters are used for ultra-dense packaged chips located adjacent to each other on 2.54 mm (0.100) spacing. Material: Contact, tarnish resistant nickel, silver- or gold-plated beryllium copper. Stainless steel hinge pin and spring. Insulation: Glass-filled nylon, blue. Rating: 500 V RMS ; 1 amp; +102°C (+216°F) max.

Manufacturer: Pomona Electronics Description: Adapter Kit Test, PLCC; 32; 1 A; 500 V (RMS) (Max.); Glass Filled Nylon; 102 de Test adapters designed for plastic-leaded chip carriers (PCC or PLCC) with “J” leads. Snap-ring design allows Quad Clip® Test Adapter to fit directly into IC, providing hands-free testing. Upper: 0.025" square pins, gold-plated, phosphor bronze. Lower: Contracts, gold-plated beryllium copper. Insulation: Glass-filled nylon, gray. Rating: 500 V RMS , 1 amp, +102°C max.

Manufacturer: Pomona Electronics Description: Adapter Kit; 44; 1 A; 500 V (RMS) (Max.); Glass-Filled Nylon; 102 degC Test adapters designed for plastic-leaded chip carriers (PCC or PLCC) with “J” leads. Snap-ring design allows Quad Clip® Test Adapter to fit directly into IC, providing hands-free testing. Upper: 0.025" square pins, gold-plated, phosphor bronze. Lower: Contracts, gold-plated beryllium copper. Insulation: Glass-filled nylon, gray. Rating: 500 V RMS , 1 amp, +102°C max. Test adapter kit operating temperature +102 °C.

Manufacturer: Pomona Electronics Description: Adapter Kit; 84; 1 A; 500 V (RMS) (Max.); Glass-Filled Nylon; 102 degC Test adapters designed for plastic-leaded chip carriers (PCC or PLCC) with “J” leads. Snap-ring design allows Quad Clip® Test Adapter to fit directly into IC, providing hands-free testing. Upper: 0.025" square pins, gold-plated, phosphor bronze. Lower: Contracts, gold-plated beryllium copper. Insulation: Glass-filled nylon, gray. Rating: 500 V RMS , 1 amp, +102°C max. Test adapter kit operating temperature +102 °C.

Manufacturer: Pomona Electronics Description: Adapter Kit Test, PLCC; 28; 1 A; 500 V (RMS) (Max.); Glass Filled Nylon; 102 de Test adapters designed for plastic-leaded chip carriers (PCC or PLCC) with “J” leads. Snap-ring design allows Quad Clip® Test Adapter to fit directly into IC, providing hands-free testing. Upper: 0.025" square pins, gold-plated, phosphor bronze. Lower: Contracts, gold-plated beryllium copper. Insulation: Glass-filled nylon, gray. Rating: 500 V RMS , 1 amp, +102°C max.

Manufacturer: Pomona Electronics Description: Adapter Kit; 52; 1 A; 500 V (RMS) (Max.); Glass-Filled Nylon; 102 degC Test adapters designed for plastic-leaded chip carriers (PCC or PLCC) with “J” leads. Snap-ring design allows Quad Clip® Test Adapter to fit directly into IC, providing hands-free testing. Upper: 0.025" square pins, gold-plated, phosphor bronze. Lower: Contracts, gold-plated beryllium copper. Insulation: Glass-filled nylon, gray. Rating: 500 V RMS , 1 amp, +102°C max. Test adapter kit operating temperature +102 °C.

Manufacturer: Pomona Electronics Description: Adapter Kit Test, PLCC; 68; 1 A; 500 V (RMS) (Max.); Glass Filled Nylon; 102 de Test adapters designed for plastic-leaded chip carriers (PCC or PLCC) with “J” leads. Snap-ring design allows Quad Clip® Test Adapter to fit directly into IC, providing hands-free testing. Upper: 0.025" square pins, gold-plated, phosphor bronze. Lower: Contracts, gold-plated beryllium copper. Insulation: Glass-filled nylon, gray. Rating: 500 V RMS , 1 amp, +102°C max.

Manufacturer: Pomona Electronics Description: Adapter Kit Test, PLCC; 20; 1 A; 500 V (RMS) (Max.); Glass Filled Nylon; 102 de Test adapters designed for plastic-leaded chip carriers (PCC or PLCC) with “J” leads. Snap-ring design allows Quad Clip® Test Adapter to fit directly into IC, providing hands-free testing. Upper: 0.025" square pins, gold-plated, phosphor bronze. Lower: Contracts, gold-plated beryllium copper. Insulation: Glass-filled nylon, gray. Rating: 500 V RMS , 1 amp, +102°C max.

Manufacturer: Pomona Electronics Description: Adapter Kit; 1 A; 500 V (RMS) (Max.); Glass-Filled Nylon; 102 degC Kit contains 6 sizes of Quad Clips: 20, 28, 32, 44, 52, 68 and 84 pin, housed in a protective case. Test adapter kit operating temperature +102 °C.